Design for Testability (DFT)From Test Strategy to Production Readiness
We deliver end-to-end DFT solutions spanning architecture, implementation, and silicon bring-up. Our approach focuses on maximizing test coverage, optimizing test cost, and enabling first-time silicon success across complex SoCs and advanced process nodes.
DFT Architecture & Test Strategy Read More →
DFT Implementation & Insertion Read More →
Test Optimization & Coverage Closure Read More →
Silicon Bring-up, Yield & Production Support Read More →
DFT Architecture & Test Strategy
Definition of scalable DFT architectures aligned with product, manufacturing, and quality goals.
- DFx architecture (DFT, DFM, DFD) for SoC, chiplets, and SiP
- Test strategy aligned to coverage, cost, and yield targets
- Early RTL evaluation for testability and coverage gaps
- Integration of IP-level DFT into SoC-level test architecture
DFT Implementation & Insertion
Complete execution of DFT flows from RTL to implementation-ready netlist.
- Scan insertion (hierarchical, compression-based)
- ATPG and fault model coverage closure
- MBIST, LBIST, and logic BIST implementation
- Boundary scan (JTAG) and test access mechanisms
- Test controller and test mode implementation
Test Optimization & Coverage Closure
Optimization of test quality, coverage, and cost for high-volume manufacturing.
- Test compression, SSN, and bandwidth optimization
- Test power management and low-power test techniques
- Memory repair and redundancy strategies
- HSIO test strategies (loopback, PRBS, BERT)
- Fault simulation and coverage improvement
Silicon Bring-up, Yield & Production Support
Enabling smooth transition from design to manufacturing and volume production.
- Collaboration with physical design for DFT-aware implementation
- ATE pattern generation and test program support
- Load board and manufacturing test planning
- Silicon debug, diagnosis, and yield improvement
- Support for characterization, burn-in, and production ramp